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I
looked at the output of simple circuit composed of a reversed biased 14 volt
Zener diode and a 10K resistor, connected in series across a DC power source.
If the voltage source was less than the Zener breakdown rating then the voltage
at the diode (Vz) is the same as the source voltage and there is no AC waveform
at the output. As the source voltage approaches the Zener breakdown, a series
of little sawtooth pulses can be see at the output that are of a few mV in
height. Increasing the source voltage to about 14.7, the number and the height
of the pulses increase to a maximum peak to peak of about 200 mV.
Viewing the output on a Sain Smart DDS140 Digital oscilloscope, I can see that the output
is a sawtooth pattern with a rise time of about 2 microseconds and a more rapid
fall time of 80 nanoseconds. The slope of the rising edge is dependent on value
of the resistor. The frequency does appear to be random, in that peaks
beginnings and endings are at irregular intervals and voltages. The scope has a
fast Fourier transformation FFT display window that shows a fairly flat
frequency spread between KHz and 6 MHz with predominant frequencies
about 1 MHz. I don't think the frequency spectrum is very useful. I need a way
to characterize each pulse.
Some VB6 Tools
Each pulse can be described by three values: the length of the pulse, the high peak voltage where the zener break-down occurs, and the depth of the
zener pulse fall. These three values can
determine the position of a point in three dimensions and can produce a 3D
scattergram of one point for each measured peak. The digital scope outputs a
text file with 8000 voltage readings taken across 100 microseconds. I wrote a VB6
program to plot those points, find the high and low peaks and plot a 3D
scattergram of the 369 random pulses observed. Yes, it looks to be a fairly
random distribution of points in 3D but I cannot think of a practical use for
this cool looking 3d data.
As I was looking at random distributions of
sawtooth peeks, it occurred to me that given enough data, I could find the
probability of a peek occurring at a given voltage. I wrote RandomWaveAnalyzer.exe to analyze raw data text files exported from the SimSmart DD140 digital
scope. It looks at the distribution of the sawtooth peeks (and troughs) to find
what is the probability that a peek will occur at a given voltage.
Surprisingly, the data falls along exponential curves, where the probability
equals a coefficient A times the constant e to the power of exponent B times
the voltage or, p = A * e ^ (B *
Volts). The program has the ability to perform a least squares regression to
find values of A and B for the best curve fit. Typically, the program finds
about 20,000 peeks among one million data points.
I wrote RanSim.exe to use the coefficient and
exponent values (A & B) that were found with the Analyzer program, to
simulate random sawtooth waveforms that are generated by zener diode circuits.
About 3,600 peeks are generated during a 10 mS simulation. Probabilities of a
peek (or of a trough) occurring at a specific voltage are then calculated on
the simulation data and then overlain onto the ideal probability curve graph. I
can even export the simulation data and analyze it using the
RandomWaveAnalyser.exe tool.
Light and Dark Experiments
Measuring from the digital scope and using the
analyze program, I looked at the effect that light had on a 14v zener diode
circuit with a 10K resistor at 14.7 volts.
A
little bit of light, generally effects the waveform by making the peaks smaller
and more frequent. There is no change in the voltage drop across the diode and
no significant change in the rate of charge (sawtooth slopes). Light has the
effect of narrowing the space between the peak and trough probability curves
and markedly increasing the size of the B terms (exponent parameters). Clearly
I will have to conduct my experiments in a light proof and in an EMF wave proof
box. I would not be surprised if the output was temperature sensitive or
sensitive to vibration (sound) or to radiation. I will have to be careful to
keep conditions controlled.
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